- Title
- Tracking of triangular references using signal transformation for control of a novel AFM scanner stage
- Creator
- Bazaei, Ali; Yong, Yuen Kuan; Moheimani, S. O. Reza; Sebastian, Abu
- Relation
- ARC
- Relation
- IEEE Transactions on Control Systems Technology Vol. 20, Issue 2, p. 453-464
- Publisher Link
- http://dx.doi.org/10.1109/TCST.2011.2114347
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- journal article
- Date
- 2012
- Description
- In this paper, we design feedback controllers for lateral and transversal axes of an atomic force microscope (AFM) piezoelectric tube scanner. The controllers are constrained to keep the standard deviation of the measurement noise fed back to the displacement output around 0.13 nm. It is shown that the incorporation of appropriate inner loops provides disturbance rejection capabilities and robustness against dc gain uncertainties, two requirements for satisfactory operation of signal transformation method. Simulations and experiments show significant improvement of steady-state tracking error with signal transformation, while limiting the projected measurement noise.
- Subject
- closed-loop bandwith; measurement noise; robustification; scanning probe microscopy; sensor fusion; signal transformation; switched control; triangular reference
- Identifier
- http://hdl.handle.net/1959.13/1311879
- Identifier
- uon:22310
- Identifier
- ISSN:1063-6536
- Language
- eng
- Reviewed
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